BS IEC 63003:2015 pdf download-Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505 TM.
4.5 CTI configuration/interoperability requirements Rule 4.5: CTI pin map requirements, as defined by general pin map requirements in Annex A, and subsequent detailed CTI pin map input/output (I/O) configuration, shall be implemented to assure test interface interoperability between agencies and ATS configurations. Recommendation 4.5: A common CTI pin map configuration has been recommended across government multi-agencies, to stimulate greater use of common assets, which reduces proliferation and support duplication. By satisfying interoperability requirements between government agencies TPS development, deployment and asset duplication can be eliminated and related weapon system support enhanced. 4.6 Maintainability/end-user support requirements Rule 4.6: The general pin map requirements in Annex A, and subsequent detailed CTI pin map I/O configuration, as part of this IEEE 1505.1 CTI document, shall be maintained/upgraded through IEEE standards revision processes. Recommendation 4.6: The CTI implementation within industry and the government, utilizing standard product configurations, multi-vendor interchangeable parts, calibration, and maintenance support is recommended. Observation 4.6: Applying common CTI products to ATS and CTI fixture deployment would dramatically reduce duplicative requirements for unique system development, validation, production, deployment, configuration product management, and long-term support. This approach would further enhance asset availability/uptime mean time between failures (MTBF), calibration/spares consolidation, and mean-time- to-repair (MTTR) results. Users could also benefit from common maintenance practices, tooling, and training costs. CTI implementation would also focus product management/feedback on a smaller number of unique installed systems, their related failures/lessons learned, and iterative improvements, resulting in improved reliability, less obsolescence, and longer life cycles.
4.7 Scaleable architecture requirements 4.7.1 Overview Rule 4.7.1: CTI shall support modular and scaleable concepts as illustrated in Figure 1. Based upon the IEEE 1505 RFI standard, CTI shall support upward scalable compatibility without modification or added extensions of a low-end (4-slot CTI configuration), and a mid-sized (20-slot CTI configuration), to a high- end (29-slot CTI configuration) test system capability.